Conference papers

Conference papers

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Gautam Gunjala; Antoine Wojdyla; Aamod Shanker; Stuart Sherwin; Markus P Benk; Kenneth A Goldberg; Patrick P Naulleau; Laura Waller

Field-varying aberration recovery in EUV microscopy using mask roughness Inproceedings

In: Computational Optical Sensing and Imaging, pp. CW2E–2, Optical Society of America 2018.

Links | BibTeX | Tags: aberrations, EUV, speckle, statistical optics

Aamod Shanker; Laura Waller; Gautam Gunjala; Antoine Wojdyla; Dmitriy Voronov; Patrick P Naulleau

Speckle metrology for extreme ultra-violet lithography Inproceedings

In: Extreme Ultraviolet (EUV) Lithography IX, pp. 105830T, International Society for Optics and Photonics 2018.

Links | BibTeX | Tags: aberrations, EUV, speckle, statistical optics

Gautam Gunjala; Aamod Shanker; Volker Jaedicke; Nick Antipa; Laura Waller

Optical transfer function characterization using a weak diffuser Inproceedings

In: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII, pp. 971315, International Society for Optics and Photonics 2016.

Links | BibTeX | Tags: aberrations, speckle, statistical optics