Publications by Aamod Shanker
2020
Extreme ultraviolet microscope characterization using photomask surface roughness Journal Article
In: Scientific Reports, vol. 10, no. 1, pp. 11673, 2020.
2018
Differential methods in phase imaging for optical lithography PhD Thesis
PhD thesis, University of California, Berkeley (May 2018), 2018.
Aberration recovery by imaging a weak diffuser Journal Article
In: Optics express, vol. 26, no. 16, pp. 21054–21068, 2018.
Field-varying aberration recovery in EUV microscopy using mask roughness Inproceedings
In: Computational Optical Sensing and Imaging, pp. CW2E–2, Optical Society of America 2018.
Speckle metrology for extreme ultra-violet lithography Inproceedings
In: Extreme Ultraviolet (EUV) Lithography IX, pp. 105830T, International Society for Optics and Photonics 2018.
Linear scattering theory in phase space (Conference Presentation) Inproceedings
In: Image Sensing Technologies: Materials, Devices, Systems, and Applications V, pp. 106560T, International Society for Optics and Photonics 2018.
Turbulent flow in coherent speckle Inproceedings
In: Mathematics in Imaging, pp. MW3D–6, Optical Society of America 2018.
2017
2017, visited: 17.04.2020.
EUV mask roughness can recover litho-tool aberrations (Conference Presentation) Inproceedings
In: International Conference on Extreme Ultraviolet Lithography 2017, pp. 104500S, International Society for Optics and Photonics 2017.
2016
Off-axis aberration estimation in an EUV microscope using natural speckle Inproceedings
In: Imaging Systems and Applications, pp. ITh1F–2, Optical Society of America 2016.
Optical transfer function characterization using a weak diffuser Inproceedings
In: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII, pp. 971315, International Society for Optics and Photonics 2016.
2015
Recovering curl using an iterative solver for the transport of intensity equation Inproceedings
In: Imaging Systems and Applications, pp. ITh2A–5, Optical Society of America 2015.
X-ray phase imaging and computed tomography with sandpaper analyzer Inproceedings
In: Computational Optical Sensing and Imaging, pp. CM3E–6, Optical Society of America 2015.
Characterizing the dependence of thick-mask edge effects on illumination angle using AIMS images Inproceedings
In: Optical Microlithography XXVIII, pp. 94260O, International Society for Optics and Photonics 2015.
Absorber topography dependence of phase edge effects Inproceedings
In: Photomask Technology 2015, pp. 96350G, International Society for Optics and Photonics 2015.
2014
Transport of intensity phase imaging in the presence of curl effects induced by strongly absorbing photomasks Journal Article
In: Applied optics, vol. 53, no. 34, pp. J1–J6, 2014.
Low-noise phase imaging by hybrid uniform and structured illumination transport of intensity equation Journal Article
In: Optics express, vol. 22, no. 22, pp. 26696–26711, 2014.
Defocus-based quantitative phase imaging by coded illumination Inproceedings
In: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, pp. 89490R, International Society for Optics and Photonics 2014.
Defocus based phase imaging for quantifying electromagnetic edge effects in photomasks Masters Thesis
Master’s thesis, University of California, Berkeley (May 2014), 2014.
Critical assessment of the transport of intensity equation as a phase recovery technique in optical lithography Inproceedings
In: Optical Microlithography XXVII, pp. 90521D, International Society for Optics and Photonics 2014.
2013
Analysis of edge effects in attenuating phase-shift masks using quantitative phase imaging Inproceedings
In: Photomask Technology 2013, pp. 88802A, International Society for Optics and Photonics 2013.